New Fault Tolerant Design Methodology Applied to Middleware Switch Processor
نویسندگان
چکیده
In this paper is presented a new fault tolerant design methodology which provides protection against three most important radiation effects – single event transients (SET), single event upsets (SEU) and single event latchup (SEL). SETs and SEUs are mitigated using the hardware redundancy. Protection against SEL effects is provided by specially designed SEL power protection cell. Combination of different protection techniques is the basis for new fault tolerant design methodology. Middleware Switch processor, which is the main part of Spacecraft Area Network is implemented using the presented design methodology and implementation characteristics are discussed.
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